Scanning Electron Microscopy (SEM)

MIL SEM

 

 

The Hitachi S-3400N is a 0.3-30Kv variable pressure (VP) SEM operating with a tungsten filament electron source. The S-3400N’s large specimen chamber accommodates traditional dried gold-coated samples for examination in secondary electron (SE) mode and wet and/or non-conductive samples without metal coating for examination in VP mode. The S-3400N features both SE imaging as well as a solid state backscattered electron (BSE) detector, real time image display with signal mixing and a computer eucentric motorized stage with -20/+90 degree tilt. 

 

 

 

Salt Crystals

 

 

 

Salt Crystals
Taken on the Hitachi S-3400N SEM

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